´ëÇпø ±³À°Graduate Program
2019 Àåºñ°³¹ß ¿öÅ©¼¥ °³ÃÖ
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2020 ¼º°ú¹ßÇ¥´ëȸ °ú±âºÎÀå°ü»ó ¼ö»ó
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Àü°ø | À̼ö±¸ºÐ | °úÁ¤ | ±³°ú¸ñ¹øÈ£ | ±³°ú¸ñ¸í / ¿µ¹® |
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°øÅë | ±âÃʰøÅë | ¼®¹Ú»ç | 8925258 | ¿¬±¸¹æ¹ý·Ð(Research Methodology) |
°øÅë | ±âÃʰøÅë | ¼®¹Ú»ç | 8925259 | ¿µ¾î³í¹®ÀÛ¼º¹×¹ßÇ¥(English paper writing and presentation) |
°øÅë | ±âÃʰøÅë | ¼®¹Ú»ç | 8925260 | ¿¬±¸¼³°è¿ÍÅë°èÀû¹æ¹ý(Research design and statistical methods |
°øÅë | ¿¬±¸°úÁ¦ | ¹Ú»ç | 8925997 | ¿¬±¸À±¸® ¹× ¿¬±¸°úÁ¦¥± (Research Ethics &Research Projects¥±) |
°øÅë | ¿¬±¸°úÁ¦ | ¼®»ç | 8925996 | ¿¬±¸À±¸® ¹×¿¬±¸°úÁ¦¥° (Research Ethics & Research Projects¥°) |
°øÅë | Àü°ø°øÅë | ¹Ú»ç | 8925263 | ¾çÀÚ´Ùü·Ð (Quantum Many-Body Theory) |
°øÅë | Àü°ø°øÅë | ¹Ú»ç | 8925232 | °í±ÞÅë°è¹°¸®ÇÐ(Advances Statistical Physics) |
°øÅë | Àü°ø°øÅë | ¹Ú»ç | 8925233 | Àåºñ°³¹ßÇÁ·ÎÁ§Æ®¥±(Instrument Development Projuct¥±) |
°øÅë | Àü°ø°øÅë | ¼®¹Ú»ç | 8925229 | ¾çÀÚ¹°¸®ÇÐ¥°(Quantum Physics¥°) |
°øÅë | Àü°ø°øÅë | ¼®¹Ú»ç | 8925230 | °íÀüÀüÀÚ±âÇÐ¥° (Classical Electromagnetics¥°) |
°øÅë | Àü°ø°øÅë | ¼®¹Ú»ç | 8925231 | °íÀü¿ªÇÐ (Classical Mechanics) |
°øÅë | Àü°ø°øÅë | ¼®¹Ú»ç | 8925261 | Çö¹Ì°æ °³·Ð(Introduction to Microscopy) |
°øÅë | Àü°ø°øÅë | ¼®¹Ú»ç | 8925262 | ±¤Çа³·Ð(Introduction to Optics) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925264 | Àåºñ°³¹ß¿ä¼Ò(Essential Elements Instrument Development) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925265 | ±¤ÇÐÀåºñ±âÃÊ(Introduction to Optical Intruments) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925266 | ºÐ±¤Àåºñ±âÃÊ(Introduction to Spectroscopy) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925267 | °í±ÞºÐ±¤Àåºñ(Advanced Spectroscopy) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925268 | Ãʰí¼Ó·¹ÀÌÀú ÀÀ¿ë(Applications of Ultrafast Lasers) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925269 | ÷´Ü ±¤ÇÐÀåºñ(Advanced Optical Intruments) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925270 | ±¤ Àü»ê ½Ã´¿(Optical Design and Simulation) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925271 | ÷´Ü ±¤ÇÐÀç·á(Advanced Optical Materials) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925272 | ŽħÇö¹Ì°æ(Scanning Electron Microscopy) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925273 | ÀüÀÚÇö¹Ì°æ(Scanning Electron Microscopy) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925274 | ÀüÀÚºöµ¿·ÂÇÐ(Electron BeamDynamics) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925275 | ¿µ»óºÐ¼®(Inage Analysis) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925276 | µ¿Àû ¿øÀÚÈû Çö¹Ì°æ(Dynamics Atomic force Microscopy) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925277 | °í±Þ¿µ»óºÐ¼®(Adavanced Image Analysis) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925278 | °í±Þ³ª³ëÇö¹Ì°æ(Advanced Nano-Microscopy) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925279 | °í±ÞÀüÀÚÇö¹Ì°æ(Advanced Scanning Electron Microscopy) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925280 | ÀüÀÚºö±¤¿ø(Electron Beam Source) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925281 | Áú·®ºÐ¼®°³·Ð(Introduction to Mass Spectroscopy) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925282 | ºÐ¼®Àåºñ¸¦ À§ÇÑ ´ëÀüÀÔÀÚÀåºñÇÐ |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925283 | °í±ÞÁú·®ºÐ¼®(Advanced Mass Spectroscopy) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925284 | Áú·®ºÐ¼® Àåºñ¿ä¼Ò±â¼ú(Essential Elements Mass Spectroscopy) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925285 | ÷´Ü Áú·®ºÐ¼®(Recent Progress in Mass Spectroscopy) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925286 | ¹°¼ººÐ¼®°³·Ð(Introduction to Physical Property Analysis) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925287 | Àڱ⹰¼ºÃøÁ¤(Magnetic Property Measurements) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925288 | ¹°¼ººÐ¼®Àåºñ(Physical Property Analysis Instruments) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925289 | °í±Þ¹°¼ººÐ¼®(Advanced Physical Property Analysis) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925290 | ¹°¼ººÐ¼®ÃøÁ¤(Physical Property Measurements) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925291 | ¿¹°¼ºÃøÁ¤(Thermal Property Measurements) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925292 | Àü±â¹°¼ºÃøÁ¤(Electrical Property Measurements) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925293 | ±ØÀú¿Â¹°¼ºÃøÁ¤ |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925294 | ÀåºñÀÚµ¿È(Physical Property Measurements) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925295 | ÀÎÅϽ±¥°(Internship¥°) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925296 | ÀÎÅϽ±¥±(Internship¥±) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925297 | »êÇÐÆ¯°(Industry-Academia Seminars) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925298 | Àåºñ°³¹ßÇÁ·ÎÁ§Æ®¥°(Instrument Development Project ¥°) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925299 | °ËÃâ±â Ư·Ð(Special Topics for Detectors) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925300 | Á¦¾î ¹× °èÃø(Control and Measurements) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925301 | ¿¬±¸Àåºñ S/W °³¹ß ¹× ½Ã¹Ä·¹ÀÌ¼Ç |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925302 | Áø°ø(Vacuum) |
¿¬±¸Àåºñ°³¹ß | Àü°ø½ÉÈ | ¼®¹Ú»ç | 8925303 | ¹Ú¸·ÁõÂø(Thin film Deposition) |
(28644) ÃæºÏ ûÁֽà ¼¿ø±¸ Ãæ´ë·Î 1, ÃæºÏ´ëÇб³ S1-1µ¿ 309È£ TEL) 043-261-2265 FAX) 043-274-7811
Copyright(C) 2020 CBNU Department of Physics. All Rights Reserved.
(28644) ÃæºÏ ûÁֽà ¼¿ø±¸ Ãæ´ë·Î 1, ÃæºÏ´ëÇб³ S1-1µ¿ 309È£
TEL) 043-261-2265
FAX) 043-274-7811
Copyright(C) 2020 CBNU Department of Physics.
All Rights Reserved.